Aeris - Research edition

Best-in-class performance

Resolution as never seen before on a benchtop X-ray diffractometer

LaB 6 measurement showing a full width half maximum value of <0.04° 2 θ . These are values never seen on a benchtop XRD.

4000

Counts Counts Counts Counts

3000

4000

0.033 °2 θ

2000

3000

1000

0.033 °2 θ

2000

0

30.20

30.40

30.60

1000

Position [°2 θ ] (Copper (Cu))

Diffraction measurement of LaB 6

0

30.20

30.40

30.60

Excellent low-angle performance

Position [°2 θ ] (Copper (Cu))

40000

Silver behenate showing the excellent low-angle performance of the system.

10000 40000

10000

0

5

10

Position [°2 θ ] (Copper (Cu))

0

5

10

Position [°2 θ ] (Copper (Cu))

Diffractogram of silver behenate

Superior linearity

With a 2theta linearity well below ± 0.02° 2θ , the peak position accuracy of the Research edition of Aeris is the best on the XRD benchtop market.

0.04

0.03

0.02

0.01

∆ °2 θ

0.00

-0.01

-0.02

-0.03

-0.04

20

40

60

80

100 140 Position [°2 θ ] (Copper (Cu)) 120

2theta linearity graph of a silicon reference standard